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T/ CSTM 01772E—2026 Test methods for square resistance and its distribution uniformity of wafer-level negative temperature coefficient (NTC) thermosensitive thin films 机翻标题： 暂无翻译，请尝试点击翻译按钮。

标准号: T/ CSTM 01772E—2026
中图分类号: L 15
ICS分类号: 31.040.30
发布单位: -
状态: 现行
发布日期: 2026年6月1日
实施日期: 2026年9月1日
摘要: This document is drafted in accordance with the rules given in the GB/T 1.1—2020 Directives for standardization-Part 1: Rules for the structure and drafting of standardizing documents and GB/T 20001.4—2015 Rules for drafting standards―Part 4: Test method standards.

tcstm 01772e—2026《test methods for square resistance and its distribution uniformity of wafer-level negative temperature coefficient (ntc) thermosensitive thin films》.pdf

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T/ CSTM 01772E—2026 Test methods for square resistance and its distribution uniformity of wafer-level negative temperature coefficient (NTC) thermosensitive thin films 机翻标题： 暂无翻译，请尝试点击翻译按钮。

T/ CSTM 01772E—2026 Test methods for square resistance and its distribution uniformity of wafer-level negative temperature coefficient (NTC) thermosensitive thin films 机翻标题：暂无翻译，请尝试点击翻译按钮。